Scanning near-field optical microscopy (SNOM)POHL, D. W.Advances in optical and electron microscopy. 1991, Vol 12, pp 243-312, issn 0065-3012, 70 p.Article

Dynamic piezoelectric translation devicesPOHL, D. W.Review of scientific instruments. 1987, Vol 58, Num 1, pp 54-57, issn 0034-6748Article

Scanning near-field optical microscopyHEINZELMANN, H; POHL, D. W.Applied physics. A, Solids and surfaces. 1994, Vol 59, Num 2, pp 89-101, issn 0721-7250Article

Near-field optics : light for the world of nano-scale sciencePOHL, D. W.Thin solid films. 1995, Vol 264, Num 2, pp 250-254, issn 0040-6090Conference Paper

Local electrical dissipation imaged by scanning force microscopyDENK, W; POHL, D. W.Applied physics letters. 1991, Vol 59, Num 17, pp 2171-2173, issn 0003-6951Article

Tracking tunneling microscopyPOHL, D. W; MÖLLER, R.Review of scientific instruments. 1988, Vol 59, Num 6, pp 840-842, issn 0034-6748Article

Near-field, far-field and imaging properties of the 2D aperture SNOMNOVOTNY, L; POHL, D. W; REGLI, P et al.Ultramicroscopy. 1995, Vol 57, Num 2-3, pp 180-188, issn 0304-3991Conference Paper

Scanning near-field optical microscopy in Basel, Rüschlikon, and Zürich : Optics in Switzerland. II: Universities and research institutesHEINZELMANN, H; HUSER, T; WILD, U. P et al.Optical engineering (Bellingham. Print). 1995, Vol 34, Num 8, pp 2441-2454, issn 0091-3286Article

Observation of metallic adhesion using the scanning tunneling microscopeDÜRIG, U; ZÜGER, O; POHL, D. W et al.Physical review letters. 1990, Vol 65, Num 3, pp 349-352, issn 0031-9007Article

Experimental observation of forces acting during scanning tunneling microscopy = Observation expérimentale de forces agissantes durant la microscopie à effet tunnel à balayageDURIG, U; GIMZEWSKI, J. K; POHL, D. W et al.Physical review letters. 1986, Vol 57, Num 19, pp 2403-2406, issn 0031-9007Article

Observation of single-particle plasmons by near-field optical microscopy = Observation de plasmons à une particule par microscopie optique quasi-champFISCHER, U. C; POHL, D. W.Physical review letters. 1989, Vol 62, Num 4, pp 458-461, issn 0031-9007Article

Near-field optical-scanning microscopyDURIG, U; POHL, D. W; ROHNER, F et al.Journal of applied physics. 1986, Vol 59, Num 10, pp 3318-3327, issn 0021-8979Article

Wide-range, low-operating-voltage, bimorph STM: application as potentiometerMURALT, P; POHL, D. W; DENK, W et al.IBM journal of research and development. 1986, Vol 30, Num 5, pp 443-450, issn 0018-8646Article

Optical stethoscopy: image recording with resolution λ/20POHL, D. W; DENK, W; LANZ, M et al.Applied physics letters. 1984, Vol 44, Num 7, pp 651-653, issn 0003-6951Article

Instrumental developments and recent experiments in near-field optical microscopyHEINZELMANN, H; LACOSTE, T; HUSER, T et al.Thin solid films. 1996, Vol 273, Num 1-2, pp 149-153, issn 0040-6090Conference Paper

Radiation coupling and image formation in scanning near-field optical microscopyPOHL, D. W; NOVOTNY, L; HECHT, B et al.Thin solid films. 1996, Vol 273, Num 1-2, pp 161-167, issn 0040-6090Conference Paper

Critical behavior in gels saturated with binary liquid mixturesMAHER, J. V; GOLDBURG, W. I; POHL, D. W et al.Physical review letters. 1984, Vol 53, Num 1, pp 60-63, issn 0031-9007Article

Combined aperture SNOM/PSTM : best of both worlds ?HECHT, B; HEINZELMANN, H; POHL, D. W et al.Ultramicroscopy. 1995, Vol 57, Num 2-3, pp 228-234, issn 0304-3991Conference Paper

Scanning near-field optical microscopy (SNOM)POHL, D. W; FISCHER, U. C; DÜRIG, U. T et al.Journal of microscopy (Print). 1988, Num 152, pp 853-861, issn 0022-2720, 3Article

Scanning tunneling microscopy and potentiometry on a semiconductor heterojunctionMURALT, P; MEIER, H; POHL, D. W et al.Applied physics letters. 1987, Vol 50, Num 19, pp 1352-1354, issn 0003-6951Article